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Author(s): Gustavo R. Alves
Manuel G. Gericota
José L. Ramalho
José M. M. Ferreira
Title: HDL approach to board-level BIST
Issue Date: 1993
Abstract: Boundary scan is now the most promising technology for testing high-complexity printed circuit boards. The number of BST components available to board-level designers is however still restricted, limiting the achievable fault coverage. The requirements to improve board-level testability are analyzed, and a corresponding set of testability building blocks are proposed. A high flexibility and reduced cost solution is described, which implements these blocks on medium-complexity PLDs using a simple and powerful HDL.
Subject: Engenharia electrotécnica, Engenharia electrotécnica, electrónica e informática
Electrical engineering, Electrical engineering, Electronic engineering, Information engineering
Scientific areas: Ciências da engenharia e tecnologias::Engenharia electrotécnica, electrónica e informática
Engineering and technology::Electrical engineering, Electronic engineering, Information engineering
Source: Proceedings of the European Design Automation Conference
Document Type: Artigo em Livro de Atas de Conferência Internacional
Rights: openAccess
Appears in Collections:FEUP - Artigo em Livro de Atas de Conferência Internacional

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