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Author(s): José M. M. Ferreira
Filipe S. Pinto
José S. Matos
Title: A modular architecture for BIST of boundary scan boards
Issue Date: 1992
Abstract: A board-level BIST architecture for boards loaded with ASICs and VLSI components, compliant with the IEEE 1149.1 BST standard, is described. This BIST architecture consists of a test processor core, with an optimized architecture for controlling the board-level BST (boundary scan test) infrastructure, an optional system-level testability bus interface, to be included when a system-level test strategy is to be implemented, and a ROM containing the test program, which is automatically generated by an ATPG tool.
Subject: Engenharia electrotécnica, Engenharia electrotécnica, electrónica e informática
Electrical engineering, Electrical engineering, Electronic engineering, Information engineering
Scientific areas: Ciências da engenharia e tecnologias::Engenharia electrotécnica, electrónica e informática
Engineering and technology::Electrical engineering, Electronic engineering, Information engineering
Source: Proceedings of the EUROASIC Conference
Document Type: Artigo em Livro de Atas de Conferência Internacional
Rights: openAccess
Appears in Collections:FEUP - Artigo em Livro de Atas de Conferência Internacional

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