Please use this identifier to cite or link to this item: http://hdl.handle.net/10216/85031
Author(s): Manuel Gericota
Gustavo Costa Alves
José Martins Ferreira
Title: Dynamically rotate and free for test: the aath for FPGA concurrent test
Issue Date: 2001
Abstract: Dynamically reconfigurable systems have benefited from a new class of FPGAs, recently introduced into the market, that enables partial and dynamic reconfiguration.While enabling concurrent reconfiguration without disturbing the system operation, this technology also raises a new test challenge: to assure a continuously fault-free operation, independently of the circuit present after many reconfiguration processes. A new structural concurrent test method, recently proposed by the authors and based on the principle of replicating and freeing the resources to be tested, raised several questions, one of them being: what strategy to follow in the process of dynamically replicating and freeing those resources?This paper presents a strategy to free the resources to be tested and the results of a series of simulation experiments made with the objective of finding the best methodology to achieve it.
Subject: Engenharia electrotécnica, Engenharia electrotécnica, electrónica e informática
Electrical engineering, Electrical engineering, Electronic engineering, Information engineering
URI: http://hdl.handle.net/10216/85031
Source: Proceedings of the 2nd Latin America Test Workshop LATW'01
Document Type: Artigo em Livro de Atas de Conferência Internacional
Rights: openAccess
License: https://creativecommons.org/licenses/by-nc/4.0/
Appears in Collections:FEUP - Artigo em Livro de Atas de Conferência Internacional

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