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Author(s): Manuel G. Gericota
Gustavo R. Alves
Miguel L. Silva
José M. Ferreira
Title: DRAFT: A scanning test methodology for dynamic and partially reconfigurable FPGAs
Issue Date: 2001
Abstract: A new class of FPGAs that enable partial and dynamic reconfiguration without disturbing system operation, raised a new test challenge: how to assure a continuously fault-free operation, independently of the circuit present after many reconfiguration processes.A new on-line test method for those FPGAs is proposed, based on a scanning methodology and in the reuse of the IEEE 1149.1 Boundary Scan test infrastructure, already widely employed for In-System Programming.
Subject: Engenharia electrotécnica, Engenharia electrotécnica, electrónica e informática
Electrical engineering, Electrical engineering, Electronic engineering, Information engineering
Scientific areas: Ciências da engenharia e tecnologias::Engenharia electrotécnica, electrónica e informática
Engineering and technology::Electrical engineering, Electronic engineering, Information engineering
Source: Proceedings of the European Test Workshop ETW'01
Document Type: Artigo em Livro de Atas de Conferência Internacional
Rights: openAccess
Appears in Collections:FEUP - Artigo em Livro de Atas de Conferência Internacional

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