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Author(s): Gustavo R. Alves
José M. M. Ferreira
Daniel Aga
Ovidiu Mosuc
Title: Debug and test of microcontroller-based applications using the boundary scan test infrastructure
Issue Date: 1997
Abstract: Microcontroller based applications are usuallydebugged with the assistance of In-circuit emulators and logicanalysers. However, these traditional debug tools represent ahuge investment for use in classes with several groups ofstudents working at the same time. The development of a newlow-cost debug tool that uses the Boundary Scan Testinfrastructure to implement the basic functionality providedby an In-circuit emulator and a logic analyser is a possiblesolution to overcome this economical problem. To reducecosts the Boundary Scan Test infrastructure is controlledthrough the parallel port of a normal Personal Computer,now widely available in classrooms.
Subject: Engenharia electrotécnica, Engenharia electrotécnica, electrónica e informática
Electrical engineering, Electrical engineering, Electronic engineering, Information engineering
Scientific areas: Ciências da engenharia e tecnologias::Engenharia electrotécnica, electrónica e informática
Engineering and technology::Electrical engineering, Electronic engineering, Information engineering
Source: Proceedings of the IEEE International Symposium on Industrial Electronics
Document Type: Artigo em Livro de Atas de Conferência Internacional
Rights: openAccess
Appears in Collections:FEUP - Artigo em Livro de Atas de Conferência Internacional

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