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https://hdl.handle.net/10216/84455
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DC Field | Value | Language |
---|---|---|
dc.creator | Gustavo R. Alves | |
dc.creator | José M. M. Ferreira | |
dc.creator | Daniel Aga | |
dc.creator | Ovidiu Mosuc | |
dc.date.accessioned | 2022-09-11T17:10:48Z | - |
dc.date.available | 2022-09-11T17:10:48Z | - |
dc.date.issued | 1997 | |
dc.identifier.other | sigarra:53172 | |
dc.identifier.uri | https://hdl.handle.net/10216/84455 | - |
dc.description.abstract | Microcontroller based applications are usually debugged with the assistance of In-circuit emulators and logic analysers. However, these traditional debug tools represent a huge investment for use in classes with several groups of students working at the same time. The development of a new low-cost debug tool that uses the Boundary Scan Test infrastructure to implement the basic functionality provided by an In-circuit emulator and a logic analyser is a possible solution to overcome this economical problem. To reduce costs the Boundary Scan Test infrastructure is controlled through the parallel port of a normal Personal Computer, now widely available in classrooms. | |
dc.language.iso | eng | |
dc.relation.ispartof | Proceedings of the IEEE International Symposium on Industrial Electronics | |
dc.rights | openAccess | |
dc.rights.uri | https://creativecommons.org/licenses/by-nc/4.0/ | |
dc.subject | Engenharia electrotécnica, Engenharia electrotécnica, electrónica e informática | |
dc.subject | Electrical engineering, Electrical engineering, Electronic engineering, Information engineering | |
dc.title | Debug and test of microcontroller-based applications using the boundary scan test infrastructure | |
dc.type | Artigo em Livro de Atas de Conferência Internacional | |
dc.contributor.uporto | Faculdade de Engenharia | |
dc.subject.fos | Ciências da engenharia e tecnologias::Engenharia electrotécnica, electrónica e informática | |
dc.subject.fos | Engineering and technology::Electrical engineering, Electronic engineering, Information engineering | |
Appears in Collections: | FEUP - Artigo em Livro de Atas de Conferência Internacional |
Files in This Item:
File | Description | Size | Format | |
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53172.pdf | Debug and Test of Microcontroller-Based Applications Using the Boundary Scan Test Infrastructure | 449.32 kB | Adobe PDF | View/Open |
This item is licensed under a Creative Commons License