Please use this identifier to cite or link to this item:
https://hdl.handle.net/10216/84051
Author(s): | José Martins Ferreira Francisco R. Fernandes Ricardo J. S. Machado Manuel G. O. Gericota |
Title: | IEEE Std 1149.7: What, Why, Where? |
Issue Date: | 2012-11 |
Abstract: | The IEEE Std 1149.7 holds the promise of great improvements for testing electronic circuits, when used along with other IEEE standards (particularly those that use the IEEE Std 1149.1 for test access and control). In this paper we describe what is the IEEE Std 1149.7, the reasons why we may consider to use it instead of IEEE Std 1149.1, and we highlight the application spectrum where this new standard can be useful. |
Subject: | Engenharia electrotécnica, Engenharia electrotécnica, electrónica e informática Electrical engineering, Electrical engineering, Electronic engineering, Information engineering |
Scientific areas: | Ciências da engenharia e tecnologias::Engenharia electrotécnica, electrónica e informática Engineering and technology::Electrical engineering, Electronic engineering, Information engineering |
URI: | https://hdl.handle.net/10216/84051 |
Source: | XXVII Conference on Design of Circuits and Integrated Systems (DCIS'2012) |
Document Type: | Artigo em Livro de Atas de Conferência Internacional |
Rights: | openAccess |
License: | https://creativecommons.org/licenses/by-nc/4.0/ |
Appears in Collections: | FEUP - Artigo em Livro de Atas de Conferência Internacional |
Files in This Item:
File | Description | Size | Format | |
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136067.pdf | 296.33 kB | Adobe PDF | View/Open |
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