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Author(s): José Martins Ferreira
Francisco R. Fernandes
Ricardo J. S. Machado
Manuel G. O. Gericota
Title: IEEE Std 1149.7: What, Why, Where?
Issue Date: 2012-11
Abstract: The IEEE Std 1149.7 holds the promise of greatimprovements for testing electronic circuits, when used alongwith other IEEE standards (particularly those that use the IEEEStd 1149.1 for test access and control). In this paper we describewhat is the IEEE Std 1149.7, the reasons why we mayconsider to use it instead of IEEE Std 1149.1, and we highlightthe application spectrum where this new standard can beuseful.
Subject: Engenharia electrotécnica, Engenharia electrotécnica, electrónica e informática
Electrical engineering, Electrical engineering, Electronic engineering, Information engineering
Source: XXVII Conference on Design of Circuits and Integrated Systems (DCIS'2012)
Document Type: Artigo em Livro de Atas de Conferência Internacional
Rights: openAccess
Appears in Collections:FEUP - Artigo em Livro de Atas de Conferência Internacional

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