IEEE Std 1149.7: What, Why, Where?

José Martins Ferreira; Francisco R. Fernandes; Ricardo J. S. Machado; Manuel G. O. Gericota

Please use this identifier to cite or link to this item: https://hdl.handle.net/10216/84051

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DC Field	Value	Language
dc.creator	José Martins Ferreira
dc.creator	Francisco R. Fernandes
dc.creator	Ricardo J. S. Machado
dc.creator	Manuel G. O. Gericota
dc.date.accessioned	2022-09-08T12:29:38Z	-
dc.date.available	2022-09-08T12:29:38Z	-
dc.date.issued	2012-11
dc.identifier.other	sigarra:136067
dc.identifier.uri	https://hdl.handle.net/10216/84051	-
dc.description.abstract	The IEEE Std 1149.7 holds the promise of great improvements for testing electronic circuits, when used along with other IEEE standards (particularly those that use the IEEE Std 1149.1 for test access and control). In this paper we describe what is the IEEE Std 1149.7, the reasons why we may consider to use it instead of IEEE Std 1149.1, and we highlight the application spectrum where this new standard can be useful.
dc.language.iso	eng
dc.relation.ispartof	XXVII Conference on Design of Circuits and Integrated Systems (DCIS'2012)
dc.rights	openAccess
dc.rights.uri	https://creativecommons.org/licenses/by-nc/4.0/
dc.subject	Engenharia electrotécnica, Engenharia electrotécnica, electrónica e informática
dc.subject	Electrical engineering, Electrical engineering, Electronic engineering, Information engineering
dc.title	IEEE Std 1149.7: What, Why, Where?
dc.type	Artigo em Livro de Atas de Conferência Internacional
dc.contributor.uporto	Faculdade de Engenharia
dc.subject.fos	Ciências da engenharia e tecnologias::Engenharia electrotécnica, electrónica e informática
dc.subject.fos	Engineering and technology::Electrical engineering, Electronic engineering, Information engineering
Appears in Collections:	FEUP - Artigo em Livro de Atas de Conferência Internacional

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