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Author(s): José Machado da Silva
Title: Low-Power In-Circuit testing of a LNA
Issue Date: 2005
Abstract: A new technique is proposed to tackle in-circuit testing of embedded RF blocks. It relies on observing the cross-correlation between its output voltage and power supply current, using a translinear cross-correlator circuit. Although a structural test is performed, simulation results show that fault detection criteria can be established based on acceptable deviations of performance characterization parameters. The case of a Low Noise Amplifier is presented.
Subject: Engenharia electrónica, Engenharia electrotécnica, electrónica e informática
Source: IMSTW
Document Type: Artigo em Livro de Atas de Conferência Internacional
Rights: openAccess
Appears in Collections:FEUP - Artigo em Livro de Atas de Conferência Internacional

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