Please use this identifier to cite or link to this item:
https://hdl.handle.net/10216/71539| Author(s): | José Machado da Silva |
| Title: | Low-Power In-Circuit testing of a LNA |
| Issue Date: | 2005 |
| Abstract: | A new technique is proposed to tackle in-circuit testing of embedded RF blocks. It relies on observing the cross-correlation between its output voltage and power supply current, using a translinear cross-correlator circuit. Although a structural test is performed, simulation results show that fault detection criteria can be established based on acceptable deviations of performance characterization parameters. The case of a Low Noise Amplifier is presented. |
| Subject: | Engenharia electrónica, Engenharia electrotécnica, electrónica e informática Electronic engineering, Electrical engineering, Electronic engineering, Information engineering |
| Scientific areas: | Ciências da engenharia e tecnologias::Engenharia electrotécnica, electrónica e informática Engineering and technology::Electrical engineering, Electronic engineering, Information engineering |
| URI: | https://repositorio-aberto.up.pt/handle/10216/71539 |
| Source: | IMSTW |
| Document Type: | Artigo em Livro de Atas de Conferência Internacional |
| Rights: | openAccess |
| License: | https://creativecommons.org/licenses/by-nc/4.0/ |
| Appears in Collections: | FEUP - Artigo em Livro de Atas de Conferência Internacional |
This item is licensed under a Creative Commons License
