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Author(s): José Machado da Silva
Pedro Mota
Gabriel Pinho
Title: A BIST Scheme for RF Power Amplifiers
Issue Date: 2006
Abstract: One can find today system-on-chip devices comprising also radio-frequency blocks. These highly integrated circuits raise extraordinary challenges for testing, jeopardizing the low cost requirements associated often to these products. A built-in self test scheme for RF power ampli- fiers based on a polynomial fitting approach is proposed here, which takes advantage of the existing local oscillator, up-conversion mixer, and pre-driver, allowing for low area overhead and performance degradation. Simulation and experimental results for gain and linearity (1 dB compression and third order interception points) obtained with a GaAs distributed amplifier are presented which confirm the validity of the method. The BIST scheme proposed for implementing this method on-chip is then described, together with preliminary simulation results.
Subject: Outras ciências da engenharia e tecnologias
Other engineering and technologies
Scientific areas: Ciências da engenharia e tecnologias::Outras ciências da engenharia e tecnologias
Engineering and technology::Other engineering and technologies
Source: XXI Design of Circuits and Integrated Systems Conference
Document Type: Artigo em Livro de Atas de Conferência Internacional
Rights: openAccess
Appears in Collections:FEUP - Artigo em Livro de Atas de Conferência Internacional

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