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Author(s): Issam Khaddour
Fernando Rocha
Luis Bento
Title: Study of surface structure and dextran incorporation into sucrose crystals using atomic force microscopy
Issue Date: 2012
Abstract: Atomic force microscopy (AFM) represents a useful tool in providing information on the mechanism of growth of sucrose and the molecular roughness of the crystal surface with changes in the supersaturation level. Moreover, a better understanding of the effect of dextran as a macromolecular nonsugar on sucrose crystal growth is obtained. Step height, and the radius of the 2D critical nucleus were determined using the AFM technique.
Subject: Outras ciências agrárias
Other Agrarian Sciences
Scientific areas: Ciências agrárias::Outras ciências agrárias
Agrarian Sciences::Other Agrarian Sciences
Related Information: info:eu-repo/grantAgreement/FCT - Fundação para a Ciência e Tecnologia/Programa de Financiamento Plurianual de Unidades de I&D/FCOMP-01-0124-FEDER-022677/PROJECTO ESTRATÉGICO - UI 511 - 2011-2012/PEst-C/EQB/UI0511/2011
Document Type: Artigo em Revista Científica Internacional
Rights: restrictedAccess
Appears in Collections:FEUP - Artigo em Revista Científica Internacional

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