Please use this identifier to cite or link to this item:
https://hdl.handle.net/10216/104515
Author(s): | Issam Khaddour Fernando Rocha Luis Bento |
Title: | Study of surface structure and dextran incorporation into sucrose crystals using atomic force microscopy |
Issue Date: | 2012 |
Abstract: | Atomic force microscopy (AFM) represents a useful tool in providing information on the mechanism of growth of sucrose and the molecular roughness of the crystal surface with changes in the supersaturation level. Moreover, a better understanding of the effect of dextran as a macromolecular nonsugar on sucrose crystal growth is obtained. Step height, and the radius of the 2D critical nucleus were determined using the AFM technique. |
Subject: | Outras ciências agrárias Other Agrarian Sciences |
Scientific areas: | Ciências agrárias::Outras ciências agrárias Agrarian Sciences::Other Agrarian Sciences |
URI: | https://hdl.handle.net/10216/104515 |
Related Information: | info:eu-repo/grantAgreement/FCT - Fundação para a Ciência e a Tecnologia/Programa de Financiamento Plurianual de Unidades de I&D/FCOMP-01-0124-FEDER-022677/PROJECTO ESTRATÉGICO - UI 511 - 2011-2012/PEst-C/EQB/UI0511/2011 |
Document Type: | Artigo em Revista Científica Internacional |
Rights: | restrictedAccess |
Appears in Collections: | FEUP - Artigo em Revista Científica Internacional |
Files in This Item:
File | Description | Size | Format | |
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55267.pdf Restricted Access | Artigo original publicado | 278.17 kB | Adobe PDF | Request a copy from the Author(s) |
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