Please use this identifier to cite or link to this item: https://hdl.handle.net/10216/84054
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dc.creatorJosé M. Ferreira
dc.creatorManuel G. Gericota
dc.creatorLuís F. Lemos
dc.creatorGustavo R. Alves
dc.creatorMário M. Barbosa
dc.date.accessioned2019-02-08T18:28:26Z-
dc.date.available2019-02-08T18:28:26Z-
dc.date.issued2006-09
dc.identifier.othersigarra:136018
dc.identifier.urihttps://repositorio-aberto.up.pt/handle/10216/84054-
dc.description.abstractTo increase the amount of logic available to the usersin SRAM-based FPGAs, manufacturers are usingnanometric technologies to boost logic density andreduce costs, making its use more attractive. However,these technological improvements also make FPGAsparticularly vulnerable to configuration memory bit-flipscaused by power fluctuations, strong electromagneticfields and radiation. This issue is particularly sensitivebecause of the increasing amount of configurationmemory cells needed to define their functionality.A short survey of the most recent publications ispresented to support the options assumed during thedefinition of a framework for implementing circuitsimmune to bit-flips induction mechanisms in memorycells, based on a customized redundant infrastructureand on a detection-and-fix controller.
dc.language.isoeng
dc.relation.ispartof2006 IEEE CONFERENCE ON EMERGING TECHNOLOGIES & FACTORY AUTOMATION, VOLS 1 -3
dc.rightsopenAccess
dc.rights.urihttps://creativecommons.org/licenses/by-nc/4.0/
dc.subjectEngenharia electrotécnica, Engenharia electrotécnica, electrónica e informática
dc.subjectElectrical engineering, Electrical engineering, Electronic engineering, Information engineering
dc.titleA framework for fault tolerant real time systems based on reconfigurable FPGAs
dc.typeArtigo em Livro de Atas de Conferência Internacional
dc.contributor.uportoFaculdade de Engenharia
dc.identifier.doi10.1109/ETFA.2006.355409
dc.subject.fosCiências da engenharia e tecnologias::Engenharia electrotécnica, electrónica e informática
dc.subject.fosEngineering and technology::Electrical engineering, Electronic engineering, Information engineering
Appears in Collections:FEUP - Artigo em Livro de Atas de Conferência Internacional

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