Please use this identifier to cite or link to this item: https://hdl.handle.net/10216/71536
Full metadata record
DC FieldValueLanguage
dc.creatorL. A. Rocha
dc.creatorLukas Mol
dc.creatorEdmond Cretu
dc.creatorReinoud F. Wolffenbuttel
dc.creatorJosé Machado da Silva
dc.date.accessioned2022-09-09T19:37:59Z-
dc.date.available2022-09-09T19:37:59Z-
dc.date.issued2008
dc.identifier.othersigarra:58553
dc.identifier.urihttps://hdl.handle.net/10216/71536-
dc.description.abstractAn electronic calibration technique for capacitive MEMS accelerometers based on the measurement of pull-in voltages is described. A combination of pull-in voltages and resonance frequency measurements can be used for the estimation of processinduced variations in device dimensions from layout and deviations in material properties from nominal value, which enables auto-calibration. Measurements on fabricated devices confirm the validity of the proposed technique and electronic calibration is experimentally demonstrated.
dc.language.isoeng
dc.relation.ispartof14th IEEE International Mixed-Signals, Sensors and Systems Test Workshop - IMSTW 2008
dc.rightsopenAccess
dc.rights.urihttps://creativecommons.org/licenses/by-nc/4.0/
dc.subjectOutras ciências da engenharia e tecnologias
dc.subjectOther engineering and technologies
dc.titleAuto-calibrated capacitive MEMS accelerometer
dc.typeArtigo em Livro de Atas de Conferência Internacional
dc.contributor.uportoFaculdade de Engenharia
dc.subject.fosCiências da engenharia e tecnologias::Outras ciências da engenharia e tecnologias
dc.subject.fosEngineering and technology::Other engineering and technologies
Appears in Collections:FEUP - Artigo em Livro de Atas de Conferência Internacional

Files in This Item:
File Description SizeFormat 
58553.pdf253.23 kBAdobe PDFThumbnail
View/Open


This item is licensed under a Creative Commons License Creative Commons