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https://hdl.handle.net/10216/71518| Author(s): | José Machado da Silva |
| Title: | A low-power oscillation based LNA BIST scheme |
| Issue Date: | 2006 |
| Abstract: | Test stimuli generation and power consumption are two Issues that jeopardize the design of built-in self test schemes. The LNA testing approach presented herein relies on converting the amplifier Into an oscillator and on using a low-power correlator to obtain a signature from the cross-correlation between the dynan-dc power supply current and the LNA's output voltage. In test mode a high fault coverage is obtained together with a low power consumption, while avoiding an extra stimulus generator. No significant performance degradation results from the added test circuitry. Concerning the Interface with the external tester, a digital signal is required to switch between normal and test modes, as well as a low frequency line to capture the correlator DC output voltage. |
| Subject: | Engenharia electrónica, Outras ciências da engenharia e tecnologias Electronic engineering, Other engineering and technologies |
| Scientific areas: | Ciências da engenharia e tecnologias::Outras ciências da engenharia e tecnologias Engineering and technology::Other engineering and technologies |
| DOI: | 10.1109/dtis.2006.1708655 |
| URI: | https://hdl.handle.net/10216/71518 |
| Source: | IEEE DTIS: 2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology, Proceedings |
| Document Type: | Artigo em Livro de Atas de Conferência Internacional |
| Rights: | restrictedAccess |
| License: | https://creativecommons.org/licenses/by-nc/4.0/ |
| Appears in Collections: | FEUP - Artigo em Livro de Atas de Conferência Internacional |
This item is licensed under a Creative Commons License
