Please use this identifier to cite or link to this item:
https://hdl.handle.net/10216/71518
Author(s): | José Machado da Silva |
Title: | A low-power oscillation based LNA BIST scheme |
Issue Date: | 2006 |
Abstract: | Test stimuli generation and power consumption are two Issues that jeopardize the design of built-in self test schemes. The LNA testing approach presented herein relies on converting the amplifier Into an oscillator and on using a low-power correlator to obtain a signature from the cross-correlation between the dynan-dc power supply current and the LNA's output voltage. In test mode a high fault coverage is obtained together with a low power consumption, while avoiding an extra stimulus generator. No significant performance degradation results from the added test circuitry. Concerning the Interface with the external tester, a digital signal is required to switch between normal and test modes, as well as a low frequency line to capture the correlator DC output voltage. |
Subject: | Engenharia electrónica, Outras ciências da engenharia e tecnologias Electronic engineering, Other engineering and technologies |
Scientific areas: | Ciências da engenharia e tecnologias::Outras ciências da engenharia e tecnologias Engineering and technology::Other engineering and technologies |
URI: | https://hdl.handle.net/10216/71518 |
Source: | IEEE DTIS: 2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology, Proceedings |
Document Type: | Artigo em Livro de Atas de Conferência Internacional |
Rights: | restrictedAccess |
License: | https://creativecommons.org/licenses/by-nc/4.0/ |
Appears in Collections: | FEUP - Artigo em Livro de Atas de Conferência Internacional |
Files in This Item:
File | Description | Size | Format | |
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56874.pdf Restricted Access | 214 kB | Adobe PDF | Request a copy from the Author(s) |
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