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Author(s): Rui Abreu
Peter Zoeteweij
Arjan J.C. van Gemund
Title: Fault Localization in Embedded Software
Issue Date: 2009
Abstract: Residual faults in embedded software are a major threat to systemsdependability, and automated diagnosis techniques help to counter this threat in two ways:as a means to improve the efficiency of the debugging process they reduce the faultdensity, and as an integral part of fault detection, isolation, and recovery mechanisms theyhelp harnessing runtime errors caused by residual faults. In this chapter we introducespectrum-based fault localization (SFL), a diagnosis technique based on statistical analysisof execution profiles. SFL requires no additional modeling effort and has a low CPU andmemory overhead, which makes it well suited for application in existing developmentenvironments and for the embedded systems domain. For deployment-time application, wecomplement SFL with light-weight generic error detection mechanisms based on programinvariants, thus giving rise to systems that can autonomously identify potentially erroneousstates, and locate the components that are likely to be involved. Using a probabilistic modelof a software system, we show that the expected diagnostic accuracy of SFL approachesthat of more expensive alternatives based on automated reasoning.
Subject: Engenharia electrotécnica, electrónica e informática
Electrical engineering, Electronic engineering, Information engineering
Scientific areas: Ciências da engenharia e tecnologias::Engenharia electrotécnica, electrónica e informática
Engineering and technology::Electrical engineering, Electronic engineering, Information engineering
Source: TRADER: Reliability of High-Volume Consumer Products
Document Type: Capítulo ou Parte de Livro
Rights: restrictedAccess
Appears in Collections:FEUP - Capítulo ou Parte de Livro

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