Please use this identifier to cite or link to this item: https://hdl.handle.net/10216/91381
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dc.creatorF. J. G. Silva
dc.creatorA. J. S. Fernandes
dc.creatorF. M. Costa
dc.creatorA. P. M. Baptista
dc.creatorE. Pereira
dc.date.accessioned2022-09-15T12:24:32Z-
dc.date.available2022-09-15T12:24:32Z-
dc.date.issued2004
dc.identifier.issn0925-9635
dc.identifier.othersigarra:56317
dc.identifier.urihttps://hdl.handle.net/10216/91381-
dc.description.abstractA Ni/Cu/Ti multilayer system is proposed to face the typical problems-related with direct diamond deposition on steel substrates, namely the lack of adhesion and growth rates. Systematic experimental work allowed achieving the best MPCVD parameter set in order to obtain both thin and thick diamond films (5-130 mum) with good morphology and adhesion with low residual stress level. In fact, a thick soft copper layer permits to accommodate the thermally-induced stresses during the cooling stage of MPCVD process, allowing good diamond film integrity. The films thus obtained are continuous and uniform, crack-free and well adhered as required in most mechanical applications. The characterization techniques were: Scanning electron microscopy (SEM) to observe morphology; mu-Raman spectroscopy to check diamond film quality and stress state evaluation; X-ray diffraction to measure the residual stresses; micro-indentation to examine the diamond film adherence; profilometry to measure the surface roughness. (C) 2003 Elsevier B.V. All rights reserved.
dc.language.isoeng
dc.rightsrestrictedAccess
dc.subjectEngenharia dos materiais
dc.subjectMaterials engineering
dc.titleA new interlayer approach for CVD diamond coating of steel substrates
dc.typeArtigo em Revista Científica Internacional
dc.contributor.uportoFaculdade de Engenharia
dc.identifier.doi10.1016/j.diamond.2003.10.081
dc.identifier.authenticusP-000-AXM
dc.subject.fosCiências da engenharia e tecnologias::Engenharia dos materiais
dc.subject.fosEngineering and technology::Materials engineering
Appears in Collections:FEUP - Artigo em Revista Científica Internacional

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