Please use this identifier to cite or link to this item:
https://hdl.handle.net/10216/57159
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DC Field | Value | Language |
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dc.creator | Pedro Fonseca Mota | |
dc.creator | José A. Machado da Silva | |
dc.creator | Ricardo A. Veiga | |
dc.date.accessioned | 2019-01-31T20:20:00Z | - |
dc.date.available | 2019-01-31T20:20:00Z | - |
dc.date.issued | 2010 | |
dc.identifier.other | sigarra:59212 | |
dc.identifier.uri | https://repositorio-aberto.up.pt/handle/10216/57159 | - |
dc.description.abstract | The estimation of 1 dB compression and third-order intercept points can be obtained after the cross-correlation between dynamic current and output voltage of radio frequency power amplifiers. This estimation is performed using actual power measures and not power inferred from voltage measurements. The underlining theory and a correlator that allows implementing this measurement on-chip are presented. The trade-off between measuring voltage and the actual power is also discussed and it is shown that different information concerning the output load is obtained when observing the PA's output voltage and power. Simulation results, obtained with the model of a prototype demonstration chip, show that good accuracy can be obtained with relatively simple measurement conditions. These results include the analysis of optimum stimuli amplitudes and the effect of noise in estimation accuracy. | |
dc.language.iso | eng | |
dc.rights | openAccess | |
dc.rights.uri | https://creativecommons.org/licenses/by-nc/4.0/ | |
dc.subject | Micro-sistemas, Engenharia de telecomunicações, Engenharia electrónica, Engenharia electrotécnica, electrónica e informática | |
dc.subject | Microsystems, Telecommunications engineering, Electronic engineering, Electrical engineering, Electronic engineering, Information engineering | |
dc.title | Estimation of RF PA Non-Linearities After Cross-Correlating Current and Output Voltage | |
dc.type | Artigo em Revista Científica Internacional | |
dc.contributor.uporto | Faculdade de Engenharia | |
dc.identifier.doi | DOI 10.1007/s10836-009-5128-0 | |
dc.identifier.authenticus | P-003-9ER | |
dc.subject.fos | Ciências da engenharia e tecnologias::Engenharia electrotécnica, electrónica e informática | |
dc.subject.fos | Engineering and technology::Electrical engineering, Electronic engineering, Information engineering | |
Appears in Collections: | FEUP - Artigo em Revista Científica Internacional |
Files in This Item:
File | Description | Size | Format | |
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59212.pdf | Journal of Electronic Testing-Volume 26, Number 1, 25-35, DOI: 10.1007/s10836-009-5128-0 | 647.25 kB | Adobe PDF | View/Open |
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