Please use this identifier to cite or link to this item:
https://hdl.handle.net/10216/162419| Author(s): | Pedro Diogo Veludo Tavares |
| Title: | Framework for Learning Mutation Testing |
| Issue Date: | 2024-09-24 |
| Subject: | Engenharia electrotécnica, electrónica e informática Electrical engineering, Electronic engineering, Information engineering |
| Scientific areas: | Ciências da engenharia e tecnologias::Engenharia electrotécnica, electrónica e informática Engineering and technology::Electrical engineering, Electronic engineering, Information engineering |
| DOI: | 10.34626/0ben-6n10 |
| TID identifier: | 203860853 |
| URI: | https://hdl.handle.net/10216/162419 |
| Document Type: | Dissertação |
| Rights: | openAccess |
| Appears in Collections: | FEUP - Dissertação |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 694172.pdf | Framework for Learning Mutation Testing | 2.01 MB | Adobe PDF |  View/Open |
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