Analog Block Evaluation with BIST Instruments

Abstract

The demands for quality and for the ability to compete in the market make it necessary not only to facilitate the testing of analog circuits but also to make them more efficient. With the increase in systems complexity and level of integration, the process of testing analog circuits has become difficult and expensive. This dissertation, proposed by Synopsys Portugal, aims to perform a study on analog Built-In Self-Test (BIST) and implement a simple analog BIST system that is capable of testing a voltage regulator and an oscillator on specifics parameters. In the regulator, the parameters to test are: Over and Under Voltage, Settling Time and Voltage Ripple. In the oscillator the parameters to test are: Frequency Drift, Settling Time and Duty-Cycle Distortion. This methodology allows for self-test operations and, thus, reduces complexity and cost associated with performing analog circuit tests. It makes it possible to test the circuits periodically throughout its lifetime and also monitors some analog parameters in real-time.