Please use this identifier to cite or link to this item: https://hdl.handle.net/10216/119470
Author(s): Joana Ribeiro
FIlipe Correia
Paulo Salvador
Luis Rebouta
Luis Alves
Eduardo Alves
Nuno Barradas
Adélio Mendes
Carlos Tavares
Title: Compositional analysis by RBS, XPS and EDX of ZnO:Al,Bi and ZnO:Ga,Bi thin films deposited by d.c. magnetron sputtering
Issue Date: 2019-03-01
URI: https://hdl.handle.net/10216/119470
Related Information: info:eu-repo/grantAgreement/Agência Nacional de Inovação S.A./P2020|COMPETE - Projetos em Copromoção/POCI-01-0247-FEDER-017796/Novos avanços tecnológicos para a terceira geração de células solaressensibilizadas com perovskita/WINPSC
Document Type: Artigo em Revista Científica Internacional
Rights: embargoedAccess
Embargo End Date: 2021-03-01
Appears in Collections:FEUP - Artigo em Revista Científica Internacional

Files in This Item:
File Description SizeFormat 
325560.pdf
  Restricted Access
1.69 MBAdobe PDF    Request a copy from the Author(s)


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.