Please use this identifier to cite or link to this item: https://hdl.handle.net/10216/85005
Author(s): Manuel G. Gericota
Gustavo R. Alves
Miguel L. Silva
José M. Ferreira
Title: A novel methodology for the concurrent test of partial and dynamically reconfigurable SRAM-based FPGAs
Issue Date: 2002
Abstract: This poster presents the first truly non-intrusive structural concurrent test approach, with the objective of testing partially and dynamically reconfigurable SRAM-based FPGAs without disturbing their operation. This is accomplished by using a new methodology to carry out the replication of active Configurable Logic Blocks (CLBs), i.e. CLBs that are part of an implemented function that is actually being used by the system, releasing it to be tested in a way that is completely transparent to the system.
Subject: Engenharia electrotécnica, Engenharia electrotécnica, electrónica e informática
Electrical engineering, Electrical engineering, Electronic engineering, Information engineering
Scientific areas: Ciências da engenharia e tecnologias::Engenharia electrotécnica, electrónica e informática
Engineering and technology::Electrical engineering, Electronic engineering, Information engineering
URI: https://hdl.handle.net/10216/85005
Source: Proceedings of the Design, Automation and Test in Europe Conference (DATE'02)
Document Type: Artigo em Livro de Atas de Conferência Internacional
Rights: openAccess
License: https://creativecommons.org/licenses/by-nc/4.0/
Appears in Collections:FEUP - Artigo em Livro de Atas de Conferência Internacional

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